SEM JEOL
High Resolution SEM JEOL 7500 FA | |
Name | High Resolution SEM JEOL 7500 FA |
Application | Making (high resolution) SEM pictures Making SEM pictures of wafers/devices during or after processing. |
Characteristics | Low voltage SEM. Possible acceleration voltages 0.1-30 kV. Loadlock, SE detectors, BSE detectors |
Specimen | Small samples up to 1.5 cm for cross section inspection. Wafers up to 2 inch for top down inspection. |
User conditions | Requires training or supervision |
Remarks |
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