X-ray Photo Electron Spectrometer, K-Alpha
X-ray Photoelectron Spectrometer equiped with depth profiling by means of argon ion sputtering and stage tilting.
K-Alpha by Thermo Scientific
Chemical surface analysis and detection of binding energies
Determination of stoichiometry, contamination levels and chemical bindings on interfaces
Analysis of top 5-10 nm of the surface
Argon ion etching; Special stage for angular resolved XPS
Max. specimen size: Regular XPS 60 (w) x 60 (l) x 20 (d) mm; AR-XPS 8 (w) x 28 (l) x 5 (d) mm