X-ray Photo electron Spectrometer (XPS), K-Alpha, Thermo Scientific

X-ray Photoelectron Spectrometer equiped with depth profiling by means of argon ion sputtering and stage tilting.

Name

K-Alpha by Thermo Scientific

Application

Chemical surface analysis and detection of binding energies

Determination of stoichiometry, contamination levels and chemical bindings on interfaces

Characteristics

Analysis of top 5-10 nm of the surface

Argon ion etching; Special stage for angular resolved XPS

Specimen

Max. specimen size: Regular XPS 60 (w) x 60 (l) x 20 (d) mm; AR-XPS 8 (w) x 28 (l) x 5 (d) mm

User conditions

Requires training

Remarks