Laser Doppler velocimetry
The Laser Doppler velocimetry (LDV) or laser Doppler anemometry (LDA) setup we have in our group can be used to accurately measure velocities in (Semi-)transparent fluids in a non-intrusive way.
Atomic force microscope
The atomic force microscope (AFM, Park Xe7) is used to obtain thickness profiles of samples at nanometer resolution.
The open-axis spincoater allows us to spincoat thin liquid films and monitor the subsequent flow of the film in situ, using a high-speed camera combined with interference microscopy.
Reflection Interference Contrast Microscope
The Reflection Interference Contrast Microscope (RICM) lets us observe thin liquid layers. Using a camera and two wavelengths of light permits precisely studying dynamic processes at the scale of 100 nm - 10 μm.
Surface Plasmon Resonance Imaging
The Surface Plasmon Resonance Imaging (SPRI) allows observing layers under 100 nm thin with high resolution regarding the thickness and refractive index of the sample.
Our local cluster has 44 CPU-nodes and 1 GPU-node, with a total of around 2500 CPU's. It is ideal as a first test environment before moving to some of the larger supercomputers in the world, that are also available to us.