Scanning Probe Microscopy
We have several facilities for scanning probe analysis of semiconductor materials. Our setups allow studying the size, shape and composition of individual nanostructures such as self-assembled quantum dots down to the atomic scale. These facilities even allow studying the properties of single impurity atoms in a semiconductor material.
This VEECO Atomic Force Microscopy setup is used for standard structural characterization measurements at the ..... (read more)
This Omicron UHV setup allows performing atomically resolved STM topography and spectroscopy ..... (read more)
This Attocube interferometric low temperature Atomic Force Microscope (AFM) allows performing ..... (read more)