Other techniques

The following analysis techniques are also available within PMP.

Film and material analysis

  • Atomic Force Microscopy
  • Raman Spectroscopy
  • Fourier Transform Infrared Spectroscopy
  • X-ray Photoelectron Spectroscopy
  • Ellipsometry (including variable angle)
  • Four-point probe
  • Contact Angle measurements

Gas phase and plasma analysis

  • Fourier Transform Infrared Spectroscopy
  • Mass Spectrometry
  • Emission spectrograph
  • Langmuir Probe
  •  Electrochemical Impedance Spectroscopy

Analysis equipment available through other channels

  • Scanning Electron Microscope (Nanolab@TU/e)
  • X-ray Diffraction and Reflection (Nanolab@TU/e)
  • Rutherford Back Scattering (AccTec)