4T300 - Microscopic Measurement Methods

Contents

In many cases macroscopic material behaviour can only be understood by studying phenomena at much smaller (micron, nanometer) scale. This course treats a number of advanced measuring techniques that enable the study of microscopic properties of materials (metals, polymers, biological materials). With these techniques topographic, mechanical and chemical properties can be measured at a (very) small scale. Among others the following techniques will be treated: Optical microscopy (bright field, dark field, phase contrast, polarization contrast, differential interference contrast, confocale microscopie and surface profilometry); electron microscopy ((environmental) scanning electron microscopy (E)SEM, element analyse (EDX), orientation imaging microscopy (OIM), and transmission electron microscopy (TEM)); scanning probe microscopy (atomic force microscopy (AFM), scanning tunneling microscopie (STM), etc.); and closely related techniques (such as nano-indentation and digital image correlation (DIC)). The underlying physical principles will be addressed concisely. Examples from faculty research and literature will be used to illustrate possibilities and restrictions of these techniques.

Learning Objectives

Acquire knowledge, insights and engineering skills with respect to the principles, use and exploitation of advanced microscopic measurement and analysis techniques in the range 10-9 to 10-2 m, for the analysis of structure-property relations in materials and microsystems.