Spectroscopic ellipsometer, Sentech
Spectroscopic ellipsometer | |
Name | Sentech 805 SE |
Application | Measurement of thickness and refractive index. Measurement of dielectric layers. |
Characteristics | Wavelength range 800-1700 nm. |
Specimen | Max 4 inch. |
User conditions | Only used by operator |
Remarks | No accurate measurement of layer-stacks. |