X-ray Photo Electron Spectrometer, K-Alpha
X-ray Photoelectron Spectrometer equiped with depth profiling by means of argon ion sputtering and stage tilting. | |
Name | K-Alpha by Thermo Scientific |
Application | Chemical surface analysis and detection of binding energies Determination of stoichiometry, contamination levels and chemical bindings on interfaces |
Characteristics | Analysis of top 5-10 nm of the surface Argon ion etching; Special stage for angular resolved XPS |
Specimen | Max. specimen size: Regular XPS 60 (w) x 60 (l) x 20 (d) mm; AR-XPS 8 (w) x 28 (l) x 5 (d) mm |
User conditions | Requires training |
Remarks |
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