Method and system for obtaining a first signal for analysis to characterize at least one periodic component thereof

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Kirenko, I., Vincent, J., Haan, de, G. & Leest, van, A.J. (2014). Method and system for obtaining a first signal for analysis to characterize at least one periodic component thereof. Patent No. US2014153800 (A1). Lees meer: Medialink/Full text

Abstract

 

A method of facilitating obtaining a first signal, for analysis to characterize at least one periodic component, includes obtaining two second signals representative of intensities of electromagnetic radiation. The first signal is at least derivable from an output signal obtainable by applying a transformation to the second signals such that any value of the output signal is based on values from each respective second signal at corresponding points in time. The method further includes obtaining a value of a variable determining influences of components of respective second signals on the output signal when the signals corresponding to the second signals are captured and the transformation is applied, by (i) analyzing the first, second and/or the output signals to select a value of a parameter corresponding to a respective one of the variables; or (ii) calculating values of at least one time-varying factor corresponding to a respective one of the variables