Abstract Dierk Raabe

Segregation Engineering enabled by the atomic scale imaging of defect structures and their chemical composition in complex materials

Dierk Raabe
Max-Planck-Institut für Eisenforschung GmbH, Max-Planck-Straβe 1, 40237 Düsseldorf, Germany

This contribution introduces into the field of Atom Probe Tomography. It provides examples how segregation and transformation mechanisms can be revealed at specific lattice defect sites by this technique. Also, recent progress in developing and using correlative methods for the joint analysis of complex materials using by Atom Probe Tomography (LEAP 3000, LEAP 5000) in conjunction with Electron Microscopy ( SEM, TEM, STEM, Cs corrected Titan Themis) and Field Ion Microscopy is presented. Measurements are conducted on the same atom probe sample tips and in some cases atomic resolution is reached.

Examples from functional and structural materials are presented including segregation effects in multicrystalline silicon solar cells and their relation to cell efficiency, superalloys for advanced turbines, high strength steels and hydrides.